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LayTec measure the Thickness of Deposition Layer During OLED in-Line Evaporation

August 28, 2008 • Posted by:



OLED-Display.net

In collaboration with Fraunhofer Institute for Photonic Microsystems (IPMS) in Dresden, Germany, LayTec has adopted its spectral reflectometer EpiR DA to an OLED in-line evaporation system to monitor

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