In collaboration with Fraunhofer Institute for Photonic Microsystems (IPMS) in Dresden, Germany, LayTec has adopted its spectral reflectometer EpiR DA to an OLED in-line evaporation system to monitor UV-VIS reflectivity spectra of individual layers during production process.
Michael Eritt, member of the group “Technologie-Module und Anlagentechnik” headed by Christian May at IPMS, uses the sensor for direct monitoring of thin-film optical properties on glas and foil substrates inside the in-line evaporation system. After each deposition step the substrate is moved to the measurement position and the sensor takes a full reflectance spectrum. The spectra allow calculating an accurate thickness of each individual layer by using special multi-layer analysis algorithms.
In 2007 LayTec started cooperation with OLED technology leaders and is now developing a complete multiple optical head system for production line monitoring and continuous quality control of OLED deposition process.
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